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Performance Evaluation of Classification Algorithms Using MCDM and Rank Correlation Method Applied on Software Defect Prediction Datasets

Ankit Mehta1 , Sandeep Upadhyay2

Section:Research Paper, Product Type: Journal Paper
Volume-7 , Issue-3 , Page no. 615-620, Mar-2019

CrossRef-DOI:   https://doi.org/10.26438/ijcse/v7i3.615620

Online published on Mar 31, 2019

Copyright © Ankit Mehta, Sandeep Upadhyay . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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IEEE Style Citation: Ankit Mehta, Sandeep Upadhyay, “Performance Evaluation of Classification Algorithms Using MCDM and Rank Correlation Method Applied on Software Defect Prediction Datasets,” International Journal of Computer Sciences and Engineering, Vol.7, Issue.3, pp.615-620, 2019.

MLA Style Citation: Ankit Mehta, Sandeep Upadhyay "Performance Evaluation of Classification Algorithms Using MCDM and Rank Correlation Method Applied on Software Defect Prediction Datasets." International Journal of Computer Sciences and Engineering 7.3 (2019): 615-620.

APA Style Citation: Ankit Mehta, Sandeep Upadhyay, (2019). Performance Evaluation of Classification Algorithms Using MCDM and Rank Correlation Method Applied on Software Defect Prediction Datasets. International Journal of Computer Sciences and Engineering, 7(3), 615-620.

BibTex Style Citation:
@article{Mehta_2019,
author = {Ankit Mehta, Sandeep Upadhyay},
title = {Performance Evaluation of Classification Algorithms Using MCDM and Rank Correlation Method Applied on Software Defect Prediction Datasets},
journal = {International Journal of Computer Sciences and Engineering},
issue_date = {3 2019},
volume = {7},
Issue = {3},
month = {3},
year = {2019},
issn = {2347-2693},
pages = {615-620},
url = {https://www.ijcseonline.org/full_paper_view.php?paper_id=3889},
doi = {https://doi.org/10.26438/ijcse/v7i3.615620}
publisher = {IJCSE, Indore, INDIA},
}

RIS Style Citation:
TY - JOUR
DO = {https://doi.org/10.26438/ijcse/v7i3.615620}
UR - https://www.ijcseonline.org/full_paper_view.php?paper_id=3889
TI - Performance Evaluation of Classification Algorithms Using MCDM and Rank Correlation Method Applied on Software Defect Prediction Datasets
T2 - International Journal of Computer Sciences and Engineering
AU - Ankit Mehta, Sandeep Upadhyay
PY - 2019
DA - 2019/03/31
PB - IJCSE, Indore, INDIA
SP - 615-620
IS - 3
VL - 7
SN - 2347-2693
ER -

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Abstract

Software Defect Prediction is one of the important research areas of the software engineering. When developing new software from the existing prototype a software defect handling is one the major factor. In order to improve the quality of the software various data mining techniques are being used and applied to obtain predictions regarding the failure of particular software component by using the past datasets or logs consisting of various software measures related to the software defects. The main objective of the research was to rank & identify the most appropriate data mining classifier algorithms from the fifteen selected algorithms such as Lazy-IBK, Lazy-K Star, Function-SMO, Function-Multilayer Perceptron,Rules-ZeroR,Rules-OneR,Rules-PART,Tree-REP,Tree-Decision stump, J48, Naïve Bayes, BayesNet, Meta- AdaBoostM1,Misc-HyperPipes & Misc-VFI. In this particular research study firstly, 15 classifiers were applied to four datasets and the classification results were measured using 12 performance measures. Second, five MCDM methods (i.e., TOPSIS, GRA, VIKOR, PROMETHEE II, and ELECTRE III) were used to rank the classification algorithms based on their performances. So finally it can be concluded that the TOPSIS & VIKOR shows strong negative correlation which depicts that there is association between the two sets and the results were found in accordance. The best algorithm for software defect prediction datasets was found to be Lazy-IBK with highest overall score of 0.8023.

Key-Words / Index Term

J48, IBK, TOPSIS, VIKOR, GRA, PROMETHEE II and ELECTRE III

References

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